Inspiring the Evolution of Embedded Design

October 5, 2021

Analog & Power

Tiny PMIC Enables 4x Faster Wearable Charging

Analog Devices (formerly Maxim Integrated) has announced its new MAX77659, a single-inductor multiple output (SIMO) power management IC (PMIC) with integrated switch-mode buck-boost charger. The MAX77659 SIMO PMIC delivers over four hours of play time after a short, ten-minute charge, and uses a single inductor to power multiple rails.

Power Supply Module Extends Electric Car Range

Texas Instruments (TI) has introduced what it claims is the industry’s smallest and most accurate 1.5W isolated DC/DC bias-supply module. The UCC14240-Q1 uses a proprietary integrated transformer technology to enable designers to cut their power solution size in half for use in high-voltage environments such as electric vehicles (EVs), hybrid EVs, motor-drive systems and grid-tied inverters.

Configurable Digital Gate Driver for SiC MOSFETs

Microchip Technology has announced a new 1200V production-ready digital gate driver, providing system developers with multiple levels of control and protection for safe, reliable operation and qualified to stringent transportation requirements. Microchip’s AgileSwitch 2ASC-12A2HP 1200V dual-channel digital gate driver with its Augmented Switching technology is production qualified and fully configurable.

Build Your Own Battery Monitor

If you think of a battery charge as “fuel” for your electronic system, “coulombs” are the “gas.” In this article, Jeff discusses the math, history and science behind Coulombs law. He then shares the details of his project to build a battery monitor based on ADI’s LTC4150 “coulomb counter” device.

28V DC-DC Converters are Space-Qualified

VPT has announced the availability of its SVLFL, SVLHF, SVLTR and SVLSA Series of 28V, space-qualified DC-DC converters. With a wide input voltage range of 15V to 50V, the SVL series of DC-DC converters are designed specifically for space applications facing harsh radiation environments, with guaranteed performance through the use of hardened semiconductor components, radiation lot acceptance testing (RLAT) of non-hardened components.