Taking advantage of its piconewton force and sub-nanometer displacement resolution, atomic force microscopy (AFM) is uniquely suited to measure nanoscale mechanical properties, especially when it comes to soft materials. Force spectroscopy is a useful nanomechanical technique to obtain both single point measurements and maps of important mechanical properties such as stiffness and adhesion. Cantilever and tip calibrations coupled with contact mechanics models enable the full analysis and interpretation of individual force curves.
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